Power Device Analyzer / Curve Tracer
with modules:
B1510A-FG = High Power Source / Monitor Module
B1511A-FG = Medium Power Source / Monitor Module
B1513B-FG = High Voltage Source / Monitor Module
All-in-one solution for power device characterization up to 1500 A & 10 kV:
Medium current measurement with high voltage bias (e.g. 500 mA at 1200 V)
μΩ on-resistance measurement capability
Accurate, sub-picoamp level, current measurement at high voltage bias
Fully automated thermal testing from -50 ℃ to +250 ℃
Fully automated capacitance (Ciss, Coss, Crss, etc.) measurement at up to 3000 V of DC bias
High power pulsed measurements down to 10 μs
Both packaged device and on-wafer IGBT/FET gate charge measurement
High voltage/high current fast switch option to characterize GaN current collapse effect
Up to five high voltage (3 kV) source/measure channels for maximum flexibility
Safe temperature dependent testing via an interlock-equipped test fixture
Switch between high-voltage and high-current measurements without the need to recable
Automatic test circuit formation for transistor junction capacitances (Ciss, Coss, Crss, Cgs, Cgd, Cds, etc.) for both packaged and on-wafer devices
Standard test fixtures with interlock for safe packaged power device testing
Supported and secure on-wafer high-power testing over 200 A and up to 10 kV
Oscilloscope view allows verification of applied voltage and current waveforms
MS Windows-based EasyEXPERT software facilitates data management and analysis
A wide selection of measurement modules available
Support for high power devices with up to 6 pins
GPIB, USB, LAN interfaces and VGA Video output port
€ 38,500 $48,125 (US)