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HOME Test and Measurement Analyzers Network Misc. Network Analyzers Keysight (Agilent) Technologies N5242A

Keysight (Agilent) Technologies N5242A

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  • $75000

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Description of Keysight (Agilent) Technologies N5242A

Categories: Analyzers Network, Misc. Network Analyzers

Manufacturer: Keysight Technologies (Agilent HP)

Model: N5242A

Condition: Used

Keysight (Agilent) Technologies N5242A Opts: 008, 010, 021, 025, 200, 898

PNA-X Microwave Network Analyzer

Product specifications of Keysight (Agilent) Technologies N5242A (From Used-Line T&M Specifications)

  • Launch Date Feb-2007
  • Instrument Type Vector, S-Parameter
  • Low end frequency limit 10 MHz
  • High End Frequency Limit 26.5 GHz
  • Output Power Range +18 dBm (power sweep range of 38 dB)
  • Input Noise Level -114 dBm at 10 Hz IF bandwidth
  • See also N5244A, N5241A, N5245A, N5247A
  • Status --

The Agilent N5242A premier-performance network analyzer is a member of the PNA Series network analyzer platform and provides highly integrated measurement capabilities for active device tests. It is an integrated vector network analyzer featuring a built-in S-parameter test set, one or two synthesized sources used for device stimulus, a hard disk drive, USB interfaces and a 10.4 inch LCD touch screen display.

The standard 2-port test set comes with six front-panel access loops. The loops provide access to the signal path between (a) the source output and the reference receiver, (b) the source output and directional coupler thru arm and (c) the coupled arm of the directional coupler and the port receiver. The standard test set also includes a solid-state internal RF transfer switch in the R1 reference-receiver path.

  • 130 dB dynamic range, 32 channels
  • Flexible architecture for multiple measurement setups
  • The only network analyzer in the industry with internal pulse modulators and pulse generators
  • Internal combing network for simplified two-tone measurements
  • Nonlinear vector analyzer capability (NVNA)
  • Large touch screen display with an intuitive user interface
  • Optional second internal source for fast measurements of amplifier intermodulation distortion and mixer/converter conversion loss. Up to 35 times faster than using traditional external sources
  • Optional combining network for simplified two-tone measurements
  • Optional internal modulators and generators for fast, simplified pulsed measurements. Up to 30 times faster than using external modulators and generators
  • Optional rear panel access loops and internal switches for signal conditioning or single-connection multiple measurements

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