- Flexible, modular architecture
- Wide measurement range with high resolution
- V: ±4 µV to ±1000 V, 0.05%
- l: ±20 fA to ±10 A, 0.2%
- Pulse measurement capabilities
- Pulse width 1 ms to 50 ms, 100 µs resolution
- High-speed measurement (typical)
- Sourcing or monitoring: 4 ms
- Vth, hFE extracting: 12 ms
- Internal memory
- Program memory: > 2000 commands (typical)
- Data memory: 4004 measurement points
|
- Flexible, modular architecture
- Wide measurement range with high resolution
- V: ±4 µV to ±1000 V, 0.05%
- l: ±20 fA to ±10 A, 0.2%
- Pulse measurement capabilities
- Pulse width 1 ms to 50 ms, 100 µs resolution
- High-speed measurement (typical)
- Sourcing or monitoring: 4 ms
- Vth, hFE extracting: 12 ms
- Internal memory
- Program memory: > 2000 commands (typical)
- Data memory: 4004 measurement points
| Note: At start of auction 6 units are available with different ROM versions: 4.1, 4.2, 3.1, 2.52, 3.1 . Please contact us prior to bidding on availability and preference. |
- Flexible, modular architecture
- Wide measurement range with high resolution
- V: ±4 µV to ±1000 V, 0.05%
- l: ±20 fA to ±10 A, 0.2%
- Pulse measurement capabilities
- Pulse width 1 ms to 50 ms, 100 µs resolution
- High-speed measurement (typical)
- Sourcing or monitoring: 4 ms
- Vth, hFE extracting: 12 ms
- Internal memory
- Program memory: > 2000 commands (typical)
- Data memory: 4004 measurement points
|
- Flexible, modular architecture
- Wide measurement range with high resolution
- V: ±4 µV to ±1000 V, 0.05%
- l: ±20 fA to ±10 A, 0.2%
- Pulse measurement capabilities
- Pulse width 1 ms to 50 ms, 100 µs resolution
- High-speed measurement (typical)
- Sourcing or monitoring: 4 ms
- Vth, hFE extracting: 12 ms
- Internal memory
- Program memory: > 2000 commands (typical)
- Data memory: 4004 measurement points
|
•Flexible, modular architecture
•Wide measurement range with high resolution
•V: ±4 µV to ±1000 V, 0.05%
•l: ±20 fA to ±10 A, 0.2%
•Pulse measurement capabilities
•Pulse width 1 ms to 50 ms, 100 µs resolution
•High-speed measurement (typical)
•Sourcing or monitoring: 4 ms
•Vth, hFE extracting: 12 ms
•Internal memory
•Program memory: > 2000 commands (typical)
•Data memory: 4004 measurement points
Offering a wide measurement range and excellent sensitivity, the HP 4142B modular dc source/monitor is a system-use dc measurement instrument especially designed for high-throughput dc semiconductor testers. A completely user-definable system component, the HP 4142B features modular architecture that allows you to build a custom configuration to suit your measurement needs.
Eight plug-in module slots can accommodate any combination of modules. Choose from two types of source/monitor units (SMUs) to force or measure up to ±200 V and ±1 A: a high-current source/monitor unit (HCU) up to ±10 A, a high voltage source/monitor unit (HVU) up to ±1000 V, a voltage source/voltage monitor unit (VS/VMU), and an analog feedback unit (AFU).The HP 4142B's instrument command and measurement datastorage capabilities, coupled with the high-speed HP-IB interface, minimize computer loading, enhance throughput, and simplify systemization.