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HOME Test and Measurement Generators Signal Generators Rohde & Schwarz SMBV100A For Sale Rohde and Schwarz SMBV100A

Rohde and Schwarz SMBV100A

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Rohde and Schwarz SMBV100A

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Description of Rohde and Schwarz SMBV100A

Categories: Generators, Signal Generators

Manufacturer: Rohde & Schwarz

Model: SMBV100A

Condition: Used

Seller: Liberty Test Equipment, Inc.

Rohde and Schwarz SMBV100A Opts: B106/SMBV-B1/SMBV-B92

Option: B106/SMBV-B1/SMBV-B92

Product specifications of Rohde and Schwarz SMBV100A (From Used-Line T&M Specifications)

  • Launch Date
  • Frequency Range Min. 9 kHz
  • Frequency Range Max. 6 GHz
  • Freq. Resolution 1 mHz
  • Output Power –120 dBm to +18 dBm (auto mode)
  • Modulation AM,FM,Pulse,Phase,FSK,I/Q,Analog,Digital,ASK,PSK,QAM
  • See also SMBV-B103, SMBV-B106
  • Status --

The R&S®SMBV100A offers excellent RF performance along with very high output level and short setting times. At the same time, the R&S®SMBV100A can be equipped with an internal baseband generator to allow generation of a number of digital standards (for example, WiMAX, HSPA+, LTE). The wide frequency range from 9 kHz to 6 GHz covers all of the important bands for digital modulation.

  • Future-proof hardware concept
  • RF section with high output level up to 6 GHz
  • Wide RF signal bandwidth of up to 120 MHz with internal signal generation
  • Maximum RF bandwidth of I/Q modulator exceeds 500 MHz
  • Always up-to-date with software upgrades
  • Straightforward signal configuration due to easy-to-use GUI
  • 2G/3G/LTE mobile radio standards
  • Wireless standards including mobile WiMAX and WLAN IEEE 802.11n
  • Excellent phase noise ensures low EVM with digital signals
  • High output level compensates for losses in test/system setup
  • Fast settling time for quicker measurements
  • Analog modulation for basic measurements
  • CW interference and AWGN simulation
  • Analog baseband outputs
  • Fast on-site servicing
  • Long calibration interval (three years) minimizes service costs
  • Straightforward modular design for short repair times
  • Optimized for high production throughput
    • Multisegment waveform mode for fast switchover between test sequences
    • High level repeatability ensures stable test conditions

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